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Technical Meeting on Trends in Analytical Applications of Synchrotron Based X-Ray Spectrometry Techniques and Developments in the Supporting Instrumentation

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Data / Hora
02/10/2017 - 06/10/2017
All Day

Vienna International Centre

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The purpose of the meeting is to highlight, review and discuss current trends in analytical applications of synchrotron based X-ray spectrometry techniques and in the development of the supporting instrumentation. The following topics are expected to be included in the programme:

• Development trends in instrumentation and their relevance for the performance of X-ray spectroscopy techniques;
• Analytical applications based on X-ray spectroscopy techniques;
• Reference materials and quality control related issues;
• Addressing current needs of IAEA Member States for access to synchrotron facilities; and
• Role of the IAEA in supporting the activities undertaken by developing Member States to incorporate synchrotron based techniques into research and development.